CP611-2N6107
70V,7A,40W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 7 A
VCE = 4 V
Test Conditions
IC = 100 mA
Test Conditions
VCE = 80 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 70 V
VBE(OFF) = 1.5 V
TC = 150 °C
Test Conditions
VCE = 60 V
Test Conditions
IC = 7 A
IB = 3 A
Test Conditions
VCE = 4 V
IC = 500 mA
f = 1 MHz
Test Conditions
VCE = 4 V
IC = 2 A
Test Conditions
VCE = 4 V
IC = 7 A
Test Conditions
VEB = 5 V
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 4 V
IC = 500 mA
f = 50 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP611-2N6107-CM | WafflePack@100 | Discontinued | 70V,7A,40W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP611-2N6107-CT | WafflePack@100 | Discontinued | 70V,7A,40W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP611-2N6107_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CPP55-BC177 | Product EOL Notice |
| Spice Model:Spice Model CP611 | Spice Model |
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