CP611-TIP42C
100V,6A,2W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 6 A
VCE = 4 V
Test Conditions
IC = 30 mA
Test Conditions
VCE = 60 V
Test Conditions
VCE = 100 V
Test Conditions
IC = 6 A
IB = 600 mA
Test Conditions
VCE = 10 V
IC = 500 mA
f = 1 MHz
Test Conditions
VCE = 4 V
IC = 300 mA
Test Conditions
VCE = 4 V
IC = 3 A
Test Conditions
VEB = 5 V
Test Conditions
VCE = 10 V
IC = 500 mA
f = 1 kHz
Test Conditions
IC = 6 A
IB1 = 0.6 A
IB2 = 0.6 A
RL = 5 Ω
Test Conditions
IC = 6 A
IB1 = 0.6 A
IB2 = 0.6 A
RL = 5 Ω
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP611-TIP42C-CT | WafflePack@100 | Discontinued | 100V,6A,2W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP611-TIP42C-WN | Wafer | Discontinued | 100V,6A,2W Bare die,99.000 X 80.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP611-TIP42C_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CPP55-BC177 | Product EOL Notice |
| Spice Model:Spice Model CP611 | Spice Model |
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