CP617-CM4957
25V,30mA,200mW Bare die,15.700 X 15.700 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
f = 450 MHz
IC = 4 mA
VCE = 10 V
Test Conditions
IC = 100 µA
Test Conditions
VCB = 10 V
Test Conditions
IC = 1 mA
Test Conditions
VCE = 10 V
IC = 2 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 2 mA
Test Conditions
IE = 100 µA
Test Conditions
VCB = 10 V
f = 1 MHz
(1.6 pF Typical)
Test Conditions
VCE = 10 V
IC = 2 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP617-CM4957-CM | WafflePack@400 | Discontinued | 25V,30mA,200mW Bare die,15.700 X 15.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP617-CM4957-CT | WafflePack@400 | Discontinued | 25V,30mA,200mW Bare die,15.700 X 15.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP617-CM4957_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:RF TRANSISTOR DIE | Product EOL Notice |
| Spice Model:Spice Model CP617 | Spice Model |
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