CP618-CM5583
30V,500mA,1W Bare die,21.700 X 21.700 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 mA
VCE = 2 V
Test Conditions
IC = 10 µA
Test Conditions
VCB = 20 V
Test Conditions
VCB = 10 V
f = 63.6 MHz
IC = 50 mA
Test Conditions
IC = 10 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
VCE = 10 V
IC = 40 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 100 mA
f = 100 MHz
Test Conditions
VCE = 2 V
IC = 40 mA
Test Conditions
VCE = 2 V
IC = 100 mA
Test Conditions
VCE = 5 V
IC = 300 mA
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 2 V
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VEB = 500 mV
f = 100 kHz
Test Conditions
VCB = 15 V
f = 100 kHz
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
Test Conditions
VCC = 31.4 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP618-CM5583-CT | WafflePack@400 | Discontinued | 30V,500mA,1W Bare die,21.700 X 21.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP618-CM5583_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:RF TRANSISTOR DIE | Product EOL Notice |
| Spice Model:Spice Model CP618 | Spice Model |