CP681-MPSH81
20V,50mA,350mW Bare die,15.000 X 15.000 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 5 mA
VCE = 10 V
Test Conditions
IC = 10 µA
Test Conditions
VCB = 10 V
Test Conditions
IC = 1 mA
Test Conditions
IC = 5 mA
IB = 500 µA
Test Conditions
VCE = 10 V
IC = 5 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 5 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 2 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP681-MPSH81-CM | WafflePack@400 | Discontinued | 20V,50mA,350mW Bare die,15.000 X 15.000 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP681_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP681 wafer process including | Product EOL Notice |
Product Support
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