CP705V-2N4033

80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Base-Emitter On Voltage (VBE(ON))
1.1 V
Base-Emitter Saturation Voltage (VBE(SAT))
900 mV
Collector-Base Breakdown Voltage (BVCBO)
80 V
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Cutoff Current (ICBO)
50 µA
Collector-Base Voltage (VCBO)
80 V
Collector-Emitter Breakdown Voltage (BVCEO)
80 V
Collector-Emitter Saturation Voltage (VCE(SAT))
150 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Voltage (VCEO)
80 V
Continuous Collector Current (IC)
1 A
Current Gain-Bandwidth Product (fT)
150 — 400 MHz
DC Current Gain (hFE)
75
DC Current Gain (hFE)
100 — 300
DC Current Gain (hFE)
40
DC Current Gain (hFE)
70
DC Current Gain (hFE)
25
Emitter-Base Cutoff Current (IEBO)
10 µA
Emitter-Base Voltage (VEBO)
5 V
Fall Time (tf)
50 ns
Input Capacitance (Cib)
110 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
20 pF
Power Dissipation (PD)
800 mW
Power Dissipation (PD)
4 W
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
350 ns
Turn On Time (ton)
100 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP705V-2N4033-CM WafflePack@400 Active 80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP705V-2N4033-CT WafflePack@400 Active 80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP705V-2N4033-WN Wafer Active 80V,1A,800mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Lead Frame Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
CP705V_WPD.PDF Device Datasheet
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Product Reliability Data:TO-92 Package Reliability Product Reliability Data
Spice Model:Spice Model PN4033 Spice Model

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AEM stands ready to assist with your latest design endeavors as your trusted partner.

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