CP705V-BCW68H

45V,800mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)

Case Type: WAFER

Base-Emitter Saturation Voltage (VBE(SAT))
1.25 V
Base-Emitter Saturation Voltage (VBE(SAT))
2 V
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Cutoff Current (ICBO)
20 nA
Collector-Base Cutoff Current (ICBO)
20 µA
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
45 V
Collector-Emitter Saturation Voltage (VCE(SAT))
300 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
700 mV
Collector-Emitter Voltage (VCEO)
45 V
Continuous Base Current (IB)
100 mA
Continuous Collector Current (IC)
800 mA
Current Gain-Bandwidth Product (fT)
200 MHz
DC Current Gain (hFE)
80
DC Current Gain (hFE)
180
DC Current Gain (hFE)
250 — 630
DC Current Gain (hFE)
100
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Cutoff Current (IEBO)
20 nA
Emitter-Base Voltage (VEBO)
5 V
Input Capacitance (Cib)
60 pF
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
6 pF
Peak Base Current (IBM)
200 mA
Peak Collector Current (ICM)
1 A
Power Dissipation (PD)
350 mW
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
357 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP705V-BCW68H-WN Wafer Active 45V,800mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP705V-BCW68H-WR Wafer Active 45V,800mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP705V_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Process Change Notice:Wafer Diameter Change from 4" Process Change Notice
Spice Model:Spice Model CP705 Spice Model

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