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CP705V-HCZT4033-CM

80V,1A,2W Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Device Datasheet

Technical Specifications

Base-Emitter Saturation Voltage (V_BE(SAT))

900 mV

Base-Emitter Saturation Voltage (V_BE(SAT))

1.1 V

Collector-Base Breakdown Voltage (BV_CBO)

80 V

Collector-Base Cutoff Current (I_CBO)

50 nA

Collector-Base Voltage (V_CBO)

80 V

Collector-Emitter Breakdown Voltage (BV_CEO)

80 V

Collector-Emitter Saturation Voltage (V_CE(SAT))

150 mV

Collector-Emitter Saturation Voltage (V_CE(SAT))

500 mV

Collector-Emitter Voltage (V_CEO)

80 V

Continuous Collector Current (I_C)

1 A

Current Gain-Bandwidth Product (f_T)

100 MHz

DC Current Gain (h_FE)

100 — 300

DC Current Gain (h_FE)

Emitter-Base Breakdown Voltage (BV_EBO)

5 V

Emitter-Base Cutoff Current (I_EBO)

10 nA

Emitter-Base Voltage (V_EBO)

5 V

Input Capacitance (C_ib)

110 pF

Junction Temperature (T_j)

-65 — 150 °C

Output Capacitance (C_ob)

20 pF

Peak Collector Current (I_CM)

1.5 A

Power Dissipation (P_D)

2 W

Storage Temperature (T_stg)

-65 — 150 °C

Thermal Resistance Junction-Ambient (Θ_JA)

62.5 °C/W

Ordering

Part	Package	Buy	Status	Description	ECCN Code	HTS Code	Termination
CP705V-HCZT4033-CM	WafflePack@400		Active	80V,1A,2W Up-Screened Bare Die MIL-PRF-38534 Class H Equivalent,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)	EAR99	8541.29.0040	PBFREE

Resources


Item	Type
No matching documents found.
Analytical Test Report:Bond Wire	Analytical Test Report
Analytical Test Report:Cap	Analytical Test Report
Analytical Test Report:Header	Analytical Test Report
Analytical Test Report:Header Assembly	Analytical Test Report
Analytical Test Report:Pure Tin Solder	Analytical Test Report
CP705V_WPD.PDF	Device Datasheet
Material Composition:TO-39	Material Composition
Package Detail Document:TO-39	Package Detail Document
Product Reliability Data:TO-39 Package Reliability	Product Reliability Data
Spice Model:Spice Model 2N4033	Spice Model