CP710V-CMPTA96

450V,500mA,350mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Base-Emitter Saturation Voltage (VBE(SAT))
1 V
Collector-Base Breakdown Voltage (BVCBO)
450 V

(500 V Typical)

Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Voltage (VCBO)
450 V
Collector-Emitter Breakdown Voltage (BVCEO)
450 V

(490 V Typical)

Collector-Emitter Saturation Voltage (VCE(SAT))
200 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
300 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV

(150 mV Typical)

Collector-Emitter Voltage (VCEO)
450 V
Continuous Collector Current (IC)
500 mA
Current Gain-Bandwidth Product (fT)
20 MHz
DC Current Gain (hFE)
40
DC Current Gain (hFE)
50 — 200

(120 Typical)

DC Current Gain (hFE)
45
DC Current Gain (hFE)
25

(35 Typical)

Emitter-Base Breakdown Voltage (BVEBO)
6 V

(9.7 V Typical)

Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage (VEBO)
6 V
Input Capacitance (Cib)
130 pF
Junction Temperature (Tj)
-65 — 150 °C
Output Capacitance (Cob)
7 pF
Power Dissipation (PD)
350 mW
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
357 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP710V-CMPTA96-CT WafflePack@400 Active 450V,500mA,350mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP710V-CMPTA96-WN Wafer Active 450V,500mA,350mW Bare die,25.980 X 25.980 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP710V-CMPTA96_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Process Change Notice:CP710V PROCESS Process Change Notice

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AEM stands ready to assist with your latest design endeavors as your trusted partner.

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