Home / Products / Die Solutions / Transistors / General Purpose Transistors / CP736V-2N3637

Ordering

CP736V-2N3637

175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Device Datasheet

Technical Specifications

Base-Emitter Saturation Voltage (V_BE(SAT))

0.8 V

Base-Emitter Saturation Voltage (V_BE(SAT))

0.65 — 0.9 V

Collector-Base Breakdown Voltage (BV_CBO)

175 V

Collector-Base Cutoff Current (I_CBO)

100 nA

Collector-Base Voltage (V_CBO)

175 V

Collector-Emitter Breakdown Voltage (BV_CEO)

175 V

Collector-Emitter Saturation Voltage (V_CE(SAT))

0.3 V

Collector-Emitter Saturation Voltage (V_CE(SAT))

0.5 V

Collector-Emitter Voltage (V_CEO)

175 V

Continuous Collector Current (I_C)

1 A

Current Gain-Bandwidth Product (f_T)

200 MHz

DC Current Gain (h_FE)

100

DC Current Gain (h_FE)

100 — 300

DC Current Gain (h_FE)

Emitter-Base Breakdown Voltage (BV_EBO)

5 V

Emitter-Base Cutoff Current (I_EBO)

50 nA

Emitter-Base Voltage (V_EBO)

5 V

Input Capacitance (C_ib)

75 pF

Junction Temperature (T_j)

-65 — 200 °C

Output Capacitance (C_ob)

10 pF

Power Dissipation (P_D)

1 W

Power Dissipation (P_D)

5 W

Storage Temperature (T_stg)

-65 — 200 °C

Thermal Resistance Junction-Ambient (Θ_JA)

175 °C/W

Thermal Resistance Junction-Case (Θ_JC)

35 °C/W

Turn Off Time (t_off)

600 ns

Turn On Time (t_on)

400 ns

Ordering

Part	Package	Status	Description	ECCN Code	HTS Code	Termination
CP736V-2N3637-CM	WafflePack@400	Active	175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)	EAR99	8541.29.0040	PBFREE
CP736V-2N3637-CT	WafflePack@400	Active	175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)	EAR99	8541.29.0040	PBFREE
CP736V-2N3637-CT20	WafflePack@20	Special Order Item	175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)	EAR99	8541.29.0040	PBFREE

Resources


Item	Type
No matching documents found.
Analytical Test Report:Bond Wire	Analytical Test Report
Analytical Test Report:Cap	Analytical Test Report
Analytical Test Report:Header	Analytical Test Report
Analytical Test Report:Header Assembly	Analytical Test Report
CP736V-2N3637_WPD.PDF	Device Datasheet
Material Composition:TO-39	Material Composition
Package Detail Document:TO-39	Package Detail Document
Product Reliability Data:TO-39 Package Reliability	Product Reliability Data