CP736V-2N3637
175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 100 V
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
VCE = 30 V
IC = 30 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 0.1 mA
Test Conditions
VCE = 10 V
IC = 1 mA
Test Conditions
VCE = 10 V
IC = 10 mA
Test Conditions
VCE = 10 V
IC = 50 mA
Test Conditions
VCE = 10 V
IC = 150 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 3 V
Test Conditions
VEB = 1 V
f = 1 MHz
Test Conditions
VCB = 20 V
f = 1 MHz
Test Conditions
VCC = 100 V
IC = 50 mA
IB1 = 5 mA
IB2 = 5 mA
VBE = 4 V
Test Conditions
VCC = 100 V
IC = 50 mA
IB1 = 5 mA
VBE = 4 V
IB2 = 5 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP736V-2N3637-CM | WafflePack@400 | Active | 175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP736V-2N3637-CT | WafflePack@400 | Active | 175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP736V-2N3637-CT20 | WafflePack@20 | Special Order Item | 175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP736V-2N3637-WN | Wafer | Active | 175V,1A,1W Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP736V-2N3637_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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