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CP736V-2N5400
120V,600mA,625mW Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 100 V
Test Conditions
VCB = 100 V
TA = 100 °C
Test Conditions
IC = 1 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 1 mA
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VCE = 5 V
IC = 50 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 3 V
Test Conditions
VCE = 5 V
IC = 250 µA
f = 15.7 kHz
RS = 1 kΩ
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP736V-2N5400-CT | WafflePack@400 | Active | 120V,600mA,625mW Bare die,17.323 X 17.323 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP736V-2N5400_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |