CP753V-MJE210
25V,5A,1.5W Bare die,65.748 X 65.748 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 A
VCE = 1 V
Test Conditions
IC = 5 A
IB = 1 A
Test Conditions
VCB = 40 V
Test Conditions
VCB = 40 V
TC = 125 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 2 A
IB = 200 mA
Test Conditions
IC = 5 A
IB = 1 A
Test Conditions
VCE = 10 V
IC = 100 mA
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
VCE = 1 V
IC = 2 A
Test Conditions
VCE = 2 V
IC = 5 A
Test Conditions
VEB = 8 V
Test Conditions
VCB = 10 V
f = 100 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP753V-MJE210-CT | WafflePack@324 | Active | 25V,5A,1.5W Bare die,65.748 X 65.748 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP753V-MJE210-WN | Wafer | Active | 25V,5A,1.5W Bare die,65.748 X 65.748 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP753V-MJE210_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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