CP788X-BCX71K
45V,100mA,350mW Bare die,13.700 X 13.700 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 mA
VCE = 5 V
Test Conditions
IC = 10 mA
IB = 250 µA
Test Conditions
IC = 50 mA
IB = 1.25 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 45 V
Test Conditions
VCB = 45 V
TA = 150 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 mA
IB = 250 µA
Test Conditions
IC = 50 mA
IB = 1.25 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
VCE = 1 V
IC = 50 mA
Test Conditions
IE = 1 µA
Test Conditions
VEB = 4 V
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 200 µA
RS = 2 kΩ
BW = 200 Hz
f = 1 Hz
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP788X-BCX71K-CT | WafflePack@400 | Active | 45V,100mA,350mW Bare die,13.700 X 13.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| Package Detail Document:WAFER | Package Detail Document |
| Spice Model:Spice Model CP788 | Spice Model |