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CP792V-2N3251A

60V,200mA,360mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
600 — 900 mV
Base-Emitter Saturation Voltage (VBE(SAT))
1.2 V
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEV)
20 nA
Collector-Emitter Saturation Voltage (VCE(SAT))
250 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current (IC)
200 mA
Current Gain-Bandwidth Product (fT)
300 MHz
DC Current Gain (hFE)
80
DC Current Gain (hFE)
90
DC Current Gain (hFE)
100 — 300
DC Current Gain (hFE)
30
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Voltage (VEBO)
5 V
Input Capacitance (Cib)
8 pF
Junction Temperature (Tj)
-65 — 200 °C
Noise Figure (NF)
6 dB
Output Capacitance (Cob)
6 pF
Power Dissipation (PD)
360 mW
Power Dissipation (PD)
1.2 W
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
486 °C/W
Thermal Resistance Junction-Case (ΘJC)
146 °C/W
Turn Off Time (toff)
250 ns
Turn On Time (ton)
70 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP792V-2N3251A-CM WafflePack@400 Active 60V,200mA,360mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE
CP792V-2N3251A-WN Wafer Active 60V,200mA,360mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP792V-2N3251A_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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