CP792V-CMPT3906
40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VCE = 30 V
VEB = 3 V
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
IC = 10 µA
Test Conditions
IC = 1 mA
Test Conditions
VCE = 30 V
VEB = 3 V
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
VCE = 20 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 100 µA
Test Conditions
VCE = 1 V
IC = 1 mA
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 50 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
IE = 10 µA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP792V-CMPT3906-CM | WafflePack@400 | Active | 40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP792V-CMPT3906-CT | WafflePack@400 | Active | 40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP792V-CMPT3906-WN | Wafer | Active | 40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP792V-CMPT3906_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP192V/CP592V DIE SHRINK | Process Change Notice |
| Process Change Notice:WAFER THICKNESS REDUCTION | Process Change Notice |
| Product EOL Notice:BLANKET PDN-BARE DIE PRODUCTS | Product EOL Notice |
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