Home / Products / Die Solutions / Transistors / Low Vce(Sat) Transistors / CP384X-CXT3090L

Ordering

CP384X-CXT3090L

15V,3A,1.2W Bare die,39.760 X 39.760 mils,Transistor-Bipolar Power (>1A)

Case Type: CHIP,WAFFLE

Device Datasheet

Technical Specifications

Collector-Base Breakdown Voltage (BV_CBO)

45 V

Collector-Base Cutoff Current (I_CBO)

100 nA

Collector-Base Voltage (V_CBO)

45 V

Collector-Emitter Breakdown Voltage (BV_CEO)

15 V

Collector-Emitter Saturation Voltage (V_CE(SAT))

50 µV

(30 µV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

150 mV

(60 mV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

200 mV

(85 mV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

300 mV

(145 mV Typical)

Collector-Emitter Voltage (V_CEO)

15 V

Continuous Collector Current (I_C)

3 A

Current Gain-Bandwidth Product (f_T)

100 MHz

DC Current Gain (h_FE)

200

DC Current Gain (h_FE)

200

DC Current Gain (h_FE)

150

Emitter-Base Breakdown Voltage (BV_EBO)

6 V

Emitter-Base Cutoff Current (I_EBO)

100 nA

Emitter-Base Voltage (V_EBO)

6 V

Junction Temperature (T_j)

-65 — 175 °C

Output Capacitance (C_ob)

100 pF

Peak Collector Current (I_CM)

5 A

Power Dissipation (P_D)

1.2 W

Storage Temperature (T_stg)

-65 — 175 °C

Thermal Resistance Junction-Ambient (Θ_JA)

125 °C/W

Ordering

Part	Package	Buy	Status	Description	ECCN Code	HTS Code	Termination
CP384X-CXT3090L-CT	WafflePack@400		Active	15V,3A,1.2W Bare die,39.760 X 39.760 mils,Transistor-Bipolar Power (>1A)	EAR99	8541.29.0040	PBFREE

Resources


Item	Type
No matching documents found.
Analytical Test Report:Active Device, Rectifier	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Switching Diode	Analytical Test Report
Analytical Test Report:Wafer Transistor	Analytical Test Report
Analytical Test Report:Wafer Zener	Analytical Test Report
Analytical Test Report:Wafer/Die	Analytical Test Report
CP384X-CXT3090L_WPD.PDF	Device Datasheet
Package Detail Document:WAFER	Package Detail Document