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CP763V-CZT955

140V,4A,3W Bare die,48.800 X 48.800 mils,Transistor-Bipolar Power (>1A)

Case Type: CHIP,WAFFLE

Device Datasheet

Technical Specifications

Base-Emitter On Voltage (V_BE(ON))

930 mV

(830 mV Typical)

Base-Emitter Saturation Voltage (V_BE(SAT))

1.04 V

(0.96 V Typical)

Collector-Base Breakdown Voltage (BV_CBO)

180 V

(200 V Typical)

Collector-Base Cutoff Current (I_CBO)

20 nA

Collector-Base Cutoff Current (I_CBO)

0.5 µA

Collector-Base Voltage (V_CBO)

180 V

Collector-Emitter Breakdown Voltage (BV_CER)

180 V

(200 V Typical)

Collector-Emitter Breakdown Voltage (BV_CEO)

140 V

(160 V Typical)

Collector-Emitter Cutoff Current (I_CER)

20 nA

Collector-Emitter Saturation Voltage (V_CE(SAT))

60 mV

(40 mV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

80 mV

(55 mV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

120 mV

(85 mV Typical)

Collector-Emitter Saturation Voltage (V_CE(SAT))

360 mV

(210 mV Typical)

Collector-Emitter Voltage (V_CEO)

140 V

Continuous Collector Current (I_C)

4 A

Current Gain-Bandwidth Product (f_T)

200 MHz

DC Current Gain (h_FE)

100

(250 Typical)

DC Current Gain (h_FE)

100 — 300

(220 Typical)

DC Current Gain (h_FE)

Emitter-Base Breakdown Voltage (BV_EBO)

7 V

(8 V Typical)

Emitter-Base Cutoff Current (I_EBO)

10 nA

Emitter-Base Voltage (V_EBO)

7 V

Junction Temperature (T_j)

-65 — 150 °C

Output Capacitance (C_ob)

33 pF

Peak Collector Current (I_CM)

10 A

Power Dissipation (P_D)

3 W

Storage Temperature (T_stg)

-65 — 150 °C

Thermal Resistance Junction-Ambient (Θ_JA)

41.7 °C/W

Turn Off Time (t_off)

410 ns

Turn On Time (t_on)

25 ns

Ordering

Part	Package	Buy	Status	Description	ECCN Code	HTS Code	Termination
CP763V-CZT955-CT	WafflePack@400		Active	140V,4A,3W Bare die,48.800 X 48.800 mils,Transistor-Bipolar Power (>1A)	EAR99	8541.29.0040	PBFREE

Resources


Item	Type
No matching documents found.
Analytical Test Report:Active Device, Rectifier	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Switching Diode	Analytical Test Report
Analytical Test Report:Wafer Transistor	Analytical Test Report
Analytical Test Report:Wafer Zener	Analytical Test Report
Analytical Test Report:Wafer/Die	Analytical Test Report
CP763V-CZT955_WPD.PDF	Device Datasheet
Package Detail Document:WAFER	Package Detail Document