Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VT = 25 V
Test Conditions
VK = 6 V
Test Conditions
IL = 3.2 mA
Test Conditions
VT = 25 V
(4.7 mA Typical)
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
1N5314 BK | Box@2,500 | Active | 100V,4.7mA Through-Hole Diode-Current Limiting Single | EAR99 | 8541.10.0050 | PBFREE | |
1N5314 TR | Tape & Reel@10,000 | Active | 100V,4.7mA Through-Hole Diode-Current Limiting Single | EAR99 | 8541.10.0050 | PBFREE | |
1N5314 W/TE BK | Box@2,500 | Active | 100V,4.7mA Through-Hole Diode-Current Limiting Single | EAR99 | 8541.10.0050 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
1N5283-5314.PDF | Device Datasheet |
Analytical Test Report:Glass Encapsulation | Analytical Test Report |
Analytical Test Report:Leadframe | Analytical Test Report |
Analytical Test Report:Sn Plating | Analytical Test Report |
Material Composition:DO-35 | Material Composition |
Package Detail Document:DO-35 | Package Detail Document |
Product Reliability Data:DO-35 Package Reliability | Product Reliability Data |
Spice Model:Spice Model 1N5314 | Spice Model |
Product Support
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Design Support
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- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development