Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VT = 25 V
Test Conditions
VK = 6 V
Test Conditions
IL = 2.4 mA
Test Conditions
VT = 25 V
(3.55 mA Typical)
Test Conditions
T1 = 25 °C
T2 = 50 °C
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
CCLM3500 BK | Box@4,000 | Discontinued | 100V,3.55mA Surface mount Diode-Current Limiting Single | EAR99 | 8541.10.0050 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
Analytical Test Report:Leadframe | Analytical Test Report |
Analytical Test Report:Sn Plating | Analytical Test Report |
CCLM0035-5750.PDF | Device Datasheet |
Material Composition:SOD-80 | Material Composition |
Package Detail Document:SOD-80 | Package Detail Document |
Process Change Notice:CLD's in SOD-80 replaced by | Process Change Notice |
Product EOL Notice:BLANKET PDN-ALL OTHER PRODUCTS | Product EOL Notice |
Product Reliability Data:SOD-80 Package Reliability | Product Reliability Data |
Spice Model:I-Spice Model CCL | Spice Model |
Spice Model:P-Spice Model CCL | Spice Model |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development