Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
if = 200 mA
vfr = 1 V
tr = 0.4 ns
Test Conditions
IF = 1 mA
Test Conditions
IF = 10 mA
Test Conditions
IF = 50 mA
Test Conditions
IF = 100 mA
Test Conditions
IF = 200 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 5 µA
Test Conditions
IF = 10 mA
IR = 10 mA
RL = 100 Ω
Test Conditions
IF = 200 mA
IR = 200 mA
RL = 100 Ω
Test Conditions
IF = 400 mA
IR = 400 mA
RL = 100 Ω
Test Conditions
VR = 50 V
Test Conditions
VR = 50 V
TA = 150 °C
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 1N3600.PDF | Device Datasheet |
| Analytical Test Report:Glass Encapsulation | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Material Composition:DO-35 | Material Composition |
| Package Detail Document:DO-35 | Package Detail Document |
| Product Reliability Data:DO-35 Package Reliability | Product Reliability Data |
| Spice Model:Spice Model 1N3600 | Spice Model |
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Design Support
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