Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 100 µA
Test Conditions
IF = 250 µA
Test Conditions
IF = 1 mA
Test Conditions
IF = 2 mA
Test Conditions
IF = 10 mA
Test Conditions
IF = 20 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 5 µA
Test Conditions
IF = 10 mA
IR = 10 mA
IREC = 1 mA
RL = 100 Ω
Test Conditions
IF = 10 mA
IR = 6 mA
IREC = 1 mA
RL = 100 Ω
Test Conditions
VR = 30 V
Test Conditions
VR = 30 V
TA = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 1N4152 BK | Box@2,500 | Discontinued | 150mA,40V Through-Hole Diode-Switching Single | EAR99 | 8541.10.0070 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 1N4151-4154.PDF | Device Datasheet |
| Analytical Test Report:Glass Encapsulation | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Material Composition:DO-35 | Material Composition |
| Package Detail Document:DO-35 | Package Detail Document |
| Product EOL Notice:various switching diodes | Product EOL Notice |
| Product Reliability Data:DO-35 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
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Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development