Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 10 mA
Test Conditions
IF = 50 mA
Test Conditions
IF = 100 mA
Test Conditions
IF = 200 mA
Test Conditions
IF = 400 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 1 mA
Test Conditions
IF = 30 mA
IR = 30 mA
IREC = 3 mA
RL = 100 Ω
Test Conditions
VR = 90 V
Test Conditions
VR = 90 V
TJ = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| BAX12 BK | Box@2,500 | Discontinued | 400mA,90V Through-Hole Diode-Switching Single | EAR99 | 8541.10.0070 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Glass Encapsulation | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| BAX12.PDF | Device Datasheet |
| Material Composition:DO-35 | Material Composition |
| Package Detail Document:DO-35 | Package Detail Document |
| Product EOL Notice:BAX12 | Product EOL Notice |
| Product Reliability Data:DO-35 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development