CDM22011-600LRFP
11A,600V Through-Hole MOSFET N-Channel Enhancement Mode - UltraMOS
Case Type: TO-220FP
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IS = 11 A
di/dt = 100 A/µs
Test Conditions
IS = 11 A
di/dt = 100 A/µs
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
IS = 11 A
(0.92 V Typical)
Test Conditions
ID = 250 µA
Test Conditions
ID(on) = 11 A
VDD = 300 V
RG = 25 Ω
Test Conditions
VGS = 30 V
Test Conditions
VGS = 30 V
Test Conditions
ID = 250 µA
(3 V Typical)
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 11 A
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 11 A
Test Conditions
ID(on) = 11 A
VDD = 300 V
RG = 25 Ω
Test Conditions
VDS = 600 V
(0.047 µA Typical)
Test Conditions
VGS = 10 V
ID = 5.5 A
(0.3 Ω Typical)
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 11 A
Test Conditions
VDD = 300 V
ID(on) = 11 A
RG = 25 Ω
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
CDM22011-600LRFP | Sleeve@50 | Active | 11A,600V Through-Hole MOSFET N-Channel Enhancement Mode - UltraMOS | EAR99 | 8541.29.0095 | PBFREE | |
CDM22011-600LRFP SL | Sleeve@50 | Active | 11A,600V Through-Hole MOSFET N-Channel Enhancement Mode - UltraMOS | EAR99 | 8541.29.0095 | PBFREE |
Resources
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Analytical Test Report:Sn Plating | Analytical Test Report |
CDM22011-600LRFP.PDF | Device Datasheet |
Package Detail Document:TO-220FP | Package Detail Document |
Process Change Notice:CP399 REPLACES CP391 | Process Change Notice |
Product Brief:600V-700V UltraMOS MOSFETs | Product Brief |
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Spice Model:Spice Model CDM22011-600LRFP | Spice Model |
Product Support
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Design Support
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- Custom electrical curves
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- Up-screening capabilities
- Special wafer diffusions
- Custom electrical curves
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development