CDM2206-800LR
6A,800V Through-Hole MOSFET N-Channel Enhancement Mode - UltraMOS
Case Type: TO-220
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IS = 6 A
di/dt = 100 A/µs
Test Conditions
IS = 6 A
di/dt = 100 A/µs
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
IS = 6 A
(0.9 V Typical)
Test Conditions
ID = 250 µA
Test Conditions
ID(on) = 6 A
VDD = 400 V
RG = 4.7 Ω
VGS = 10 V
Test Conditions
VGS = 30 V
Test Conditions
VGS = 30 V
Test Conditions
ID = 250 µA
(3.2 V Typical)
Test Conditions
VDS = 640 V
VGS = 10 V
ID = 6 A
Test Conditions
VDS = 640 V
VGS = 10 V
ID = 6 A
Test Conditions
ID(on) = 6 A
VDD = 400 V
RG = 4.7 Ω
VGS = 10 V
Test Conditions
VDS = 800 V
Test Conditions
VGS = 10 V
ID = 3 A
(0.8 Ω Typical)
Test Conditions
VDS = 640 V
VGS = 10 V
ID = 6 A
Test Conditions
VDD = 400 V
ID(on) = 6 A
RG = 4.7 Ω
VGS = 10 V
Test Conditions
VDD = 400 V
ID(on) = 6 A
RG = 4.7 Ω
VGS = 10 V
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
CDM2206-800LR SL | Sleeve@50 | Discontinued | 6A,800V Through-Hole MOSFET N-Channel Enhancement Mode - UltraMOS | EAR99 | 8541.29.0095 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
Analytical Test Report:Die Attach | Analytical Test Report |
Analytical Test Report:Leadframe | Analytical Test Report |
Analytical Test Report:Sn Plating | Analytical Test Report |
Analytical Test Report:Tin Plating | Analytical Test Report |
CDM2206-800LR.PDF | Device Datasheet |
Material Composition:TO-220 | Material Composition |
Package Detail Document:TO-220 | Package Detail Document |
Product Brief:800V UltraMOS MOSFETs | Product Brief |
Product Brief:PB HV MOSFET | Product Brief |
Product EOL Notice:CDM22012-800LRFP | Product EOL Notice |
Product Reliability Data:TO-220 Package Reliability | Product Reliability Data |
Spice Model:Spice Model CDM2206-800LR | Spice Model |
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Design Support
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