CMLDM7003J

280mA,50V Surface mount MOSFET Dual N-Channel Enhancement Mode

Case Type: SOT-563

Common Source Input Capacitance (Ciss)
60 pF
Common Source Output Capacitance (Coss)
25 pF
Common Source Reverse Transfer Capacitance (Crss)
5 pF
Continuous Drain Current (ID)
280 mA
Diode Forward On Voltage (VSD)
1.4 V
Drain-Gate Voltage (VDG)
50 V
Drain-Source Breakdown Voltage (BVDSS)
50 V
Drain-Source Voltage (VDS)
50 V
Forward Transconductance (gFS)
200 mS
Gate Leakage Current, Forward (IGSSF)
100 nA
Gate Leakage Current, Forward (IGSSF)
2 µA
Gate Leakage Current, Forward (IGSSF)
2 µA
Gate Leakage Current, Reverse (IGSSR)
100 nA
Gate Leakage Current, Reverse (IGSSR)
2 µA
Gate Leakage Current, Reverse (IGSSR)
2 µA
Gate Threshold Voltage (VGS(th))
0.49 — 1 V
Gate-Drain Charge (Qgd)
0.156 nC
Gate-Source Charge (Qgs)
0.148 nC
Gate-Source Voltage (VGS)
12 V
Junction Temperature (Tj)
-65 — 150 °C
Maximum Pulsed Drain Current (IDM)
1.5 A
Power Dissipation (PD)
350 mW
Power Dissipation (PD)
300 mW
Power Dissipation (PD)
150 mW
Saturation Drain Current (IDSS)
50 nA
Static Drain-Source On Resistance (rDS(ON))
3 Ω

(1.6 Ω Typical)

Static Drain-Source On Resistance (rDS(ON))
2.5 Ω

(1.3 Ω Typical)

Static Drain-Source On Resistance (rDS(ON))
2 Ω

(1.1 Ω Typical)

Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
357 °C/W
Total Gate Charge (Qg)
0.764 nC

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CMLDM7003J BK Box@5,000 Active 280mA,50V Surface mount MOSFET Dual N-Channel Enhancement Mode EAR99 8541.21.0095 PBFREE
CMLDM7003J TR Tape & Reel@3,000 Active 280mA,50V Surface mount MOSFET Dual N-Channel Enhancement Mode EAR99 8541.21.0095 PBFREE

Resources

Analytical Test Report:Copper Bond Wire Analytical Test Report
Analytical Test Report:Gold Bond Wire Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
CMLDM7003.PDF Device Datasheet
Material Composition:SOT-563 Material Composition
Package Detail Document:SOT-563 Package Detail Document
Process Change Notice:Copper Wire Bonding - SOT-563 Process Change Notice
Process Change Notice:SOT-563 Alternate Lead Frame Process Change Notice
Product Reliability Data:SOT-563 Package Reliability Product Reliability Data

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AEM stands ready to assist with your latest design endeavors as your trusted partner.

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