Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VGS = 15 V
VDD = 800 V
ID = 20 A
Test Conditions
VDS = 1000 V
f = 1 MHz
Test Conditions
VDS = 1000 V
f = 1 MHz
Test Conditions
VDS = 1000 V
f = 1 MHz
Test Conditions
IS = 5 A
Test Conditions
VDS = 800 V
VGS = 15 V
ID = 20 A
Test Conditions
VGS = 15 V
(30 pA Typical)
Test Conditions
f = 1 MHz
Test Conditions
ID = 10 mA
VDS = 15 V
(2.6 V Typical)
Test Conditions
VDS = 800 V
VGS = 15 V
ID = 20 A
Test Conditions
VDS = 1200 V
(45 nA Typical)
Test Conditions
VGS = 15 V
ID = 10 A
(80 mΩ Typical)
Test Conditions
VGS = 15 V
VDS = 800 V
ID = 20 A
Test Conditions
VDS = 10 V
ID = 10 A
Test Conditions
VGS = 15 V
VDS = 800 V
ID = 20 A
Test Conditions
VGS = 15 V
VDS = 800 V
ID = 20 A
Test Conditions
VDS = 800 V
VGS = 15 V
ID = 20 A
Test Conditions
VGS = 15 V
VDS = 800 V
ID = 20 A
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CDMS24780-170 SL | Sleeve@30 | Active | 1700V Through-Hole MOSFET N-Channel SiC | EAR99 | 8541.29.0095 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Molding Compound | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Analytical Test Report:Wire | Analytical Test Report |
| Material Composition:TO-247 | Material Composition |
| Package Detail Document:TO-247 | Package Detail Document |
| Product Reliability Data:TO-247 Package Reliability | Product Reliability Data |