Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 50 mA
Test Conditions
VS = 40 V
Test Conditions
VS = 40 V
Test Conditions
VS = 10 V
RG = 1 MΩ
Test Conditions
VS = 10 V
RG = 10 kΩ
Test Conditions
VS = 10 V
RG = 1 MΩ
Test Conditions
VS = 10 V
RG = 10 kΩ
Test Conditions
VB = 20 V
CC = 0.2 µF
Test Conditions
VB = 20 V
CC = 0.2 µF
Test Conditions
VS = 10 V
RG = 1 MΩ
Test Conditions
VS = 10 V
RG = 10 kΩ
Test Conditions
VS = 10 V
RG = 200 Ω
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N6027 APM | Ammo@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | LEAD or TIN | |
| 2N6027 APP H | Ammo@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | LEAD or TIN | |
| 2N6027 TRA H | Tape & Reel@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | LEAD or TIN | |
| 2N6027 TRB | Tape & Reel@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | LEAD or TIN | |
| 2N6027 TRE | Tape & Reel@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | LEAD or TIN | |
| 2N6027-5T | Box@2,000 | Active | 40V,150mA Through-Hole Programmable UJT | EAR99 | 8541.30.0080 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N6027-6028.PDF | Device Datasheet |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Copper Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Lead Frame | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |