Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
ITM = 2 A
(1.6 V Typical)
Test Conditions
VD = 12 V
RL = 10 Ω
Test Conditions
VD = 12 V
RL = 10 Ω
(0.65 V Typical)
Test Conditions
RGK = 1 kΩ
Test Conditions
VDRM = 800 V
RGK = 1 kΩ
Test Conditions
VDRM = 800 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VD = 536 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VRRM = 800 V
RGK = 1 kΩ
Test Conditions
VRRM = 800 V
RGK = 1 kΩ
TC = 125 °C
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
CS18NZ | Box@2,000 | Active | 1A,800V Through-Hole SCR | EAR99 | 8541.30.0080 | PBFREE |
Resources
Item | Type |
---|---|
No matching documents found. | |
Analytical Test Report:Bond Wire | Analytical Test Report |
Analytical Test Report:Cap | Analytical Test Report |
Analytical Test Report:Header | Analytical Test Report |
Analytical Test Report:Header Assembly | Analytical Test Report |
Analytical Test Report:Pure Tin Solder | Analytical Test Report |
CS18BZ_SERIES.PDF | Device Datasheet |
Material Composition:TO-18 | Material Composition |
Package Detail Document:TO-18 | Package Detail Document |
Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
Product Support
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- Supply management (Customer portals)
- Inventory bonding
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- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development