Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
ITM = 6.6 A
(1.6 V Typical)
Test Conditions
VD = 300 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VD = 12 V
RL = 10 Ω
(38 µA Typical)
Test Conditions
VD = 12 V
RL = 10 Ω
(0.55 V Typical)
Test Conditions
IT = 50 mA
RGK = 1 kΩ
(0.25 mA Typical)
Test Conditions
VDRM = 800 V
RGK = 1 kΩ
Test Conditions
VDRM = 800 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VD = 533 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VRRM = 800 V
RGK = 1 kΩ
Test Conditions
VRRM = 800 V
RGK = 1 kΩ
TC = 125 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CS39-4N | Box@500 | Active | 4A,800V Through-Hole SCR | EAR99 | 8541.30.0080 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| CS39-4B.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Process Change Notice:CS39-4M | Process Change Notice |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |