2N5308
300mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 200 mA
VCE = 5 V
Test Conditions
IC = 200 mA
IB = 200 µA
Test Conditions
IC = 100 nA
Test Conditions
VCB = 40 V
Test Conditions
VCB = 40 V
TA = 100 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 200 mA
IB = 200 µA
Test Conditions
VCE = 5 V
IC = 2 mA
f = 10 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
Test Conditions
VCE = 5 V
IC = 100 mA
Test Conditions
IE = 100 nA
Test Conditions
VEB = 12 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
f = 1 kHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N5308 APM | Ammo@2,000 | Active | 300mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0095 | LEAD or TIN | |
| 2N5308 APP | Ammo@2,000 | Active | 300mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0095 | LEAD or TIN | |
| 2N5308 TRA | Tape & Reel@2,000 | Active | 300mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0095 | LEAD or TIN | |
| 2N5308 TRE | Tape & Reel@2,000 | Active | 300mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0095 | LEAD or TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N5306_5308.PDF | Device Datasheet |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Copper Wire | Analytical Test Report |
| Analytical Test Report:Epoxy Adhesive | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Free | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Process Change Notice:CP327V replacing CP307V | Process Change Notice |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
Product Support
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