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2N6427

500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington

Case Type: TO-92

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Technical Specifications

Similar Products with Selected Specifications
Base-Emitter On Voltage (VBE(ON))
1.75 V
Base-Emitter Saturation Voltage (VBE(SAT))
2 V
Collector-Base Breakdown Voltage (BVCBO)
40 V
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage (VCBO)
40 V
Collector-Emitter Breakdown Voltage (BVCEO)
40 V
Collector-Emitter Cutoff Current (ICEO)
1 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
1.2 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1.5 V
Collector-Emitter Voltage (VCEO)
40 V
Continuous Collector Current (IC)
500 mA
DC Current Gain (hFE)
10 — 100 x103
DC Current Gain (hFE)
20 — 200 x103
DC Current Gain (hFE)
14 — 140 x103
Emitter-Base Breakdown Voltage (BVEBO)
12 V
Emitter-Base Cutoff Current (IEBO)
50 nA
Emitter-Base Voltage (VEBO)
12 V
Junction Temperature (Tj)
-55 — 150 °C
Power Dissipation (PD)
625 mW
Power Dissipation (PD)
1.5 W
Storage Temperature (Tstg)
-55 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
200 °C/W
Thermal Resistance Junction-Case (ΘJC)
83.3 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N6427 Box@2,500 Active 500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington EAR99 8541.21.0095 LEAD or TIN
2N6427 APM Ammo@2,000 Active 500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington EAR99 8541.21.0095 LEAD or TIN
2N6427 TRE Tape & Reel@2,000 Active 500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington EAR99 8541.21.0095 LEAD or TIN
2N6427-5T Box@2,000 Active 500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington EAR99 8541.21.0095 PBFREE

Resources

Item Type
Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Copper Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
LSSGP074.PDF Device Datasheet
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Process Change Notice:CP327V replacing CP307V Process Change Notice
Product Reliability Data:TO-92 Package Reliability Product Reliability Data

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