BSS52
1A Through-Hole Transistor-Small Signal (<=1A) NPN Darlington
Case Type: TO-39
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 150 mA
VCE = 10 V
Test Conditions
IC = 500 mA
VCE = 10 V
Test Conditions
IC = 500 mA
IB = 500 µA
Test Conditions
IC = 1 A
IB = 4 mA
Test Conditions
VCB = 80 V
Test Conditions
IC = 500 mA
IB = 500 µA
Test Conditions
IC = 500 mA
IB = 500 µA
TA = 200 °C
Test Conditions
IC = 1 A
IB = 4 mA
Test Conditions
IC = 1 A
IB = 4 mA
TA = 200 °C
Test Conditions
VCE = 10 V
IC = 150 mA
Test Conditions
VCE = 10 V
IC = 500 mA
Test Conditions
VEB = 4 V
Test Conditions
VCE = 5 V
IC = 500 mA
f = 35 MHz
Test Conditions
VCC = 10 V
IC = 500 mA
IB1 = 500 µA
IB2 = 500 µA
Test Conditions
VCC = 10 V
IC = 1 A
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCC = 10 V
IC = 500 mA
IB1 = 500 µA
Test Conditions
VCC = 10 V
IC = 1 A
IB1 = 1 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| BSS52 | Box@500 | Discontinued | 1A Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0095 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| BSS50-52.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product EOL Notice:CP101 wafer process | Product EOL Notice |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development