D40C4
500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington
Case Type: TO-202
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 500 mA
IB = 0.5 mA
Test Conditions
VCB = 40 V
TC = 150 °C
Test Conditions
IC = 10 mA
Test Conditions
VCE = 40 V
Test Conditions
IC = 500 mA
IB = 0.5 mA
Test Conditions
VCE = 5 V
IC = 20 mA
Test Conditions
VCE = 5 V
IC = 200 mA
Test Conditions
VEB = 13 V
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCC = 10 V
IC = 1 A
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCC = 10 V
IC = 1 A
IB1 = 1 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| D40C4 | Sleeve@50 | Discontinued | 500mA,40V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Lead Frame | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| D40C4.PDF | Device Datasheet |
| Material Composition:TO-202 | Material Composition |
| Package Detail Document:TO-202 | Package Detail Document |
| Product EOL Notice:All Product in the TO-202 and | Product EOL Notice |
| Product Reliability Data:TO-202 Package Reliability | Product Reliability Data |
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