MPSA27
500mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 mA
VCE = 5 V
Test Conditions
IC = 100 µA
Test Conditions
VCB = 50 V
Test Conditions
IC = 100 µA
Test Conditions
VCE = 50 V
Test Conditions
IC = 100 mA
IB = 100 µA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VCE = 5 V
IC = 100 mA
Test Conditions
VEB = 10 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| MPSA27 | Box@2,500 | Active | 500mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0075 | LEAD or TIN | |
| MPSA27 APM | Ammo@2,000 | Active | 500mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0075 | LEAD or TIN | |
| MPSA27 TRE | Tape & Reel@2,000 | Active | 500mA,60V Through-Hole Transistor-Small Signal (<=1A) NPN Darlington | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
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| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| MPSA26-27.PDF | Device Datasheet |
| Package Detail Document:TO-92 | Package Detail Document |
| Process Change Notice:CP327V replacing CP307V | Process Change Notice |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
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Design Support
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