2N1700

40V,1A,5W Through-Hole Transistor-Small Signal (<=1A) NPN High Current

Case Type: TO-39

Base-Emitter On Voltage (VBE(ON))
2 V
Collector-Base Cutoff Current (ICBO)
75 µA
Collector-Base Cutoff Current (ICBO)
1 mA
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEV)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
40 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Voltage (VCEV)
60 V
Collector-Emitter Voltage (VCEO)
40 V
Continuous Base Current (IB)
750 mA
Continuous Collector Current (IC)
1 A
DC Current Gain (hFE)
20 — 80
Delay Time (td)
0.2 µs
Emitter-Base Cutoff Current (IEBO)
25 µA
Emitter-Base Voltage (VEBO)
6 V
Fall Time (tf)
1 µs
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
150 pF
Power Dissipation (PD)
5 W
Rise Time (tr)
1 µs
Small Signal Current Gain (hfe)
40
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
0.6 µs

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N1700 Box@500 Active 40V,1A,5W Through-Hole Transistor-Small Signal (<=1A) NPN High Current EAR99 8541.29.0095 LEAD or TIN

Resources

Analytical Test Report:Bond Wire Analytical Test Report
Analytical Test Report:Bond Wire Analytical Test Report
Analytical Test Report:Cap Analytical Test Report
Analytical Test Report:Cap Analytical Test Report
Analytical Test Report:Header Analytical Test Report
Analytical Test Report:Header Analytical Test Report
Analytical Test Report:Header Assembly Analytical Test Report
Analytical Test Report:Header Assembly Analytical Test Report
Analytical Test Report:Pure Tin Solder Analytical Test Report
Analytical Test Report:Pure Tin Solder Analytical Test Report
LSSGP059.PDF Device Datasheet
Material Composition:TO-39 Material Composition
Material Composition:TO-39 Material Composition
Package Detail Document:TO-39 Package Detail Document
Package Detail Document:TO-39 Package Detail Document
Product Reliability Data:TO-39 Package Reliability Product Reliability Data
Product Reliability Data:TO-39 Package Reliability Product Reliability Data

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  • Application and design sample kits
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