2N2221A
40V,800mA,400mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 60 V
Test Conditions
VCB = 60 V
TA = 150 °C
Test Conditions
VCB = 10 V
f = 31.8 MHz
IE = 20 mA
Test Conditions
IC = 10 mA
Test Conditions
VCE = 60 V
VBE(OFF) = 3 V
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 20 V
IC = 20 mA
f = 100 MHz
Test Conditions
VCE = 10 V
IC = 100 µA
Test Conditions
VCE = 10 V
IC = 1 mA
Test Conditions
VCE = 10 V
IC = 10 mA
Test Conditions
VCE = 10 V
IC = 10 mA
TA = -55 °C
Test Conditions
VCE = 10 V
IC = 150 mA
Test Conditions
VCE = 1 V
IC = 150 mA
Test Conditions
VCE = 10 V
IC = 500 mA
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 0.5 V
Test Conditions
IE = 10 µA
Test Conditions
VEB = 3 V
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VEB = 0.5 V
f = 100 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 10 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 10 mA
f = 1 kHz
Test Conditions
VCB = 10 V
f = 100 kHz
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
VBE = 0.5 V
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 10 mA
f = 1 kHz
Test Conditions
VCC = 30 V
IC = 150 mA
IB1 = 15 mA
IB2 = 15 mA
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 10 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N2221A | Box@2,000 | Discontinued | 40V,800mA,400mW Through-Hole Transistor-Small Signal (<=1A) NPN High Current | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N2221A.PDF | Device Datasheet |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product EOL Notice:2N2218A | Product EOL Notice |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- Custom electrical curves
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development