2N2484

60V,50mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise

Case Type: TO-18

Base-Emitter On Voltage (VBE(ON))
500 — 700 mV
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Cutoff Current (ICBO)
10 nA
Collector-Base Cutoff Current (ICBO)
10 µA
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEO)
2 nA
Collector-Emitter Saturation Voltage (VCE(SAT))
350 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current (IC)
50 mA
Current Gain-Bandwidth Product (fT)
15 MHz
Current Gain-Bandwidth Product (fT)
60 MHz
DC Current Gain (hFE)
100 — 500
DC Current Gain (hFE)
20
DC Current Gain (hFE)
175
DC Current Gain (hFE)
200
DC Current Gain (hFE)
250
DC Current Gain (hFE)
800
DC Current Gain (hFE)
30
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Cutoff Current (IEBO)
10 nA
Emitter-Base Voltage (VEBO)
6 V
Input Capacitance (Cib)
6 pF
Input Impedance Common Emitter (hie)
3.5 — 24 kΩ
Junction Temperature (Tj)
-65 — 200 °C
Noise Figure (NF)
3 dB
Noise Figure (NF)
10 dB
Noise Figure (NF)
2 dB
Noise Figure (NF)
3 dB
Output Admittance Common Emitter (hoe)
40 µS
Output Capacitance (Cob)
6 pF
Power Dissipation (PD)
360 mW
Small Signal Current Gain (hfe)
150 — 900
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
486 °C/W
Voltage Feedback Ratio Common Emitter (hre)
0.8 x10-3

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N2484 Box@2,000 Active 60V,50mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise EAR99 8541.90.0000 LEAD or TIN

Resources

2N2484.PDF Device Datasheet
Analytical Test Report:Bond Wire Analytical Test Report
Analytical Test Report:Cap Analytical Test Report
Analytical Test Report:Header Analytical Test Report
Analytical Test Report:Header Assembly Analytical Test Report
Material Composition:TO-18 Material Composition
Package Detail Document:TO-18 Package Detail Document
Product Reliability Data:TO-18 Package Reliability Product Reliability Data