2N3246
45V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 5 mA
IB = 0.5 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 40 V
Test Conditions
VCB = 40 V
TA = 150 °C
Test Conditions
IC = 1 mA
Test Conditions
IC = 5 mA
IB = 0.5 mA
Test Conditions
VCE = 5 V
IC = 1 mA
f = 30 MHz
Test Conditions
VCE = 5 V
IC = 1 µA
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 100 µA
Test Conditions
VCE = 5 V
IC = 500 µA
Test Conditions
VCE = 5 V
IC = 1 mA
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 8 V
Test Conditions
VCB = 6 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 5 V
IC = 10 µA
f = 15 kHz
RG = 10 kΩ
Test Conditions
VCB = 6 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCE = 6 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 6 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N3246 | Box@2,000 | Active | 45V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N3246.PDF | Device Datasheet |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
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Design Support
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