2N3403

25V,500mA,1W Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise

Case Type: TO-92

Base-Emitter Saturation Voltage (VBE(SAT))
0.85 V
Collector-Base Cutoff Current (ICBO)
0.1 µA
Collector-Base Cutoff Current (ICBO)
15 µA
Collector-Base Voltage (VCBO)
25 V
Collector-Emitter Breakdown Voltage (BVCEO)
25 V
Collector-Emitter Saturation Voltage (VCE(SAT))
0.3 V
Collector-Emitter Voltage (VCEO)
25 V
Continuous Collector Current (IC)
500 mA
DC Current Gain (hFE)
180 — 540
Emitter-Base Cutoff Current (IEBO)
0.1 µA
Emitter-Base Voltage (VEBO)
5 V
Input Impedance Common Emitter (hie)
9000 Ω
Junction Temperature (Tj)
-65 — 150 °C
Output Admittance Common Emitter (hoe)
21 µS
Power Dissipation (PD)
1 W
Small Signal Current Gain (hfe)
180
Small Signal Current Gain (hfe)
330
Storage Temperature (Tstg)
-65 — 150 °C
Voltage Feedback Ratio Common Emitter (hre)
0.45 x10-3

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N3403 Box@500 Active 25V,500mA,1W Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise EAR99 8541.29.0095 PBFREE

Resources

Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Copper Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
LSSGP078.PDF Device Datasheet
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Product Reliability Data:TO-92 Package Reliability Product Reliability Data

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