2N3808
60V,50mA,250mW Through-Hole Transistor-Small Signal (<=1A) Dual PNP Low Noise Amplifier
Case Type: TO-78
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 µA
VCE = 5 V
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 100 µA
Test Conditions
IC = 100 µA
IB = 10 µA
Test Conditions
IC = 1 mA
IB = 100 µA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 50 V
Test Conditions
VCB = 50 V
TA = 150 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 100 µA
IB = 10 µA
Test Conditions
IC = 1 mA
IB = 100 µA
Test Conditions
VCE = 5 V
IC = 500 µA
f = 30 MHz
Test Conditions
VCE = 5 V
IC = 1 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 10 µA
Test Conditions
VCE = 5 V
IC = 100 µA
Test Conditions
VCE = 5 V
IC = 100 µA
TA = -55 °C
Test Conditions
VCE = 5 V
IC = 500 µA
Test Conditions
VCE = 5 V
IC = 1 mA
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VCE = 5 V
IC = 100 µA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 4 V
Test Conditions
VEB = 0.5 V
f = 100 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 100 µA
f = 100 Hz
RS = 3 kΩ
Test Conditions
VCE = 10 V
IC = 100 µA
f = 1 kHz
RS = 3 kΩ
Test Conditions
VCE = 10 V
IC = 100 µA
f = 10 kHz
RS = 3 kΩ
Test Conditions
VCE = 10 V
IC = 100 µA
f = 15.7 kHz
RS = 3 kΩ
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 100 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N3808 | Box@100 | Discontinued | 60V,50mA,250mW Through-Hole Transistor-Small Signal (<=1A) Dual PNP Low Noise Amplifier | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| LSSGP070.PDF | Device Datasheet |
| Material Composition:TO-78 | Material Composition |
| Package Detail Document:TO-78 | Package Detail Document |
| Product EOL Notice:TO-78 CASE | Product EOL Notice |
Product Support
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Design Support
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- Free quick ship samples (2nd day air)
- Online technical data and parametric search
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- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development