2N3860
30V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 µA
Test Conditions
VCB = 30 V
Test Conditions
VCB = 30 V
TA = 100 °C
Test Conditions
IC = 1 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
VCE = 10 V
IC = 2 mA
Test Conditions
VCE = 4.5 V
IC = 2 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 5 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N3860 | Box@2,500 | Active | 30V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN | |
| 2N3860 APM | Ammo@2,000 | Active | 30V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN | |
| 2N3860 TRE | Tape & Reel@2,000 | Active | 30V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
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|---|---|
| No matching documents found. | |
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| Analytical Test Report:Tin Plating | Analytical Test Report |
| LSSGP072.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
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Design Support
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