2N3868
60V,3A,1W Through-Hole Transistor-Bipolar Power (>1A) PNP General Purpose Amplifier/Switch
Case Type: TO-39
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 1.5 A
IB = 150 mA
Test Conditions
IC = 2.5 A
IB = 250 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 60 V
TC = 150 °C
Test Conditions
IC = 20 mA
Test Conditions
VCE = 60 V
VBE(OFF) = 2 V
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 1.5 A
IB = 150 mA
Test Conditions
IC = 2.5 A
IB = 250 mA
Test Conditions
VCE = 5 V
IC = 100 mA
f = 20 MHz
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
VCE = 2 V
IC = 1.5 A
Test Conditions
VCE = 3 V
IC = 2.5 A
Test Conditions
VCC = 30 V
IC = 1.5 A
IB1 = 150 mA
Test Conditions
IE = 100 µA
Test Conditions
VCC = 30 V
IC = 1.5 A
IB1 = 150 mA
IB2 = 150 mA
Test Conditions
VEB = 3 V
f = 1 MHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCC = 30 V
IC = 1.5 A
IB1 = 150 mA
Test Conditions
VCC = 30 V
IC = 1.5 A
IB1 = 150 mA
IB2 = 150 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N3868 | Box@500 | Active | 60V,3A,1W Through-Hole Transistor-Bipolar Power (>1A) PNP General Purpose Amplifier/Switch | EAR99 | 8541.29.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| LSSGP062.PDF | Device Datasheet |
| Material Composition:TO-39 | Material Composition |
| Package Detail Document:TO-39 | Package Detail Document |
| Product Reliability Data:TO-39 Package Reliability | Product Reliability Data |
Product Support
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Design Support
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