2N4014
50V,500mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN General Purpose Amplifier/Switch
Case Type: TO-18
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 300 mA
IB = 30 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 800 mA
IB = 80 mA
Test Conditions
IC = 1 A
IB = 100 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 60 V
Test Conditions
VCB = 60 V
TA = 100 °C
Test Conditions
IC = 10 µA
Test Conditions
IC = 10 mA
Test Conditions
VCE = 80 V
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 300 mA
IB = 30 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 800 mA
IB = 80 mA
Test Conditions
IC = 1 A
IB = 100 mA
Test Conditions
VCE = 10 V
IC = 50 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCE = 1 V
IC = 300 mA
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
VCE = 2 V
IC = 800 mA
Test Conditions
VCE = 5 V
IC = 1 A
Test Conditions
VCE = 1 V
IC = 100 mA
TA = -55 °C
Test Conditions
VCE = 1 V
IC = 500 mA
TA = -55 °C
Test Conditions
IE = 10 µA
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCC = 30 V
IC = 500 mA
IB1 = 50 mA
IB2 = 50 mA
Test Conditions
VCC = 30 V
IC = 500 mA
IB1 = 50 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N4014 | Box@2,000 | Discontinued | 50V,500mA,360mW Through-Hole Transistor-Small Signal (<=1A) NPN General Purpose Amplifier/Switch | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N4014.PDF | Device Datasheet |
| Analytical Test Report:Bond Wire | Analytical Test Report |
| Analytical Test Report:Cap | Analytical Test Report |
| Analytical Test Report:Header | Analytical Test Report |
| Analytical Test Report:Header Assembly | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder | Analytical Test Report |
| Material Composition:TO-18 | Material Composition |
| Package Detail Document:TO-18 | Package Detail Document |
| Product EOL Notice:CP337V WAFER PROCESS | Product EOL Notice |
| Product Reliability Data:TO-18 Package Reliability | Product Reliability Data |
| Spice Model:Spice Model 2N4014 | Spice Model |
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Design Support
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- Special wafer diffusions
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- Application notes
- Application and design sample kits
- Custom product and package development