2N4035

40V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch

Case Type: TO-18

Base-Emitter Saturation Voltage (VBE(SAT))
0.75 V
Base-Emitter Saturation Voltage (VBE(SAT))
0.7 — 0.9 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.1 V
Collector-Base Breakdown Voltage (BVCBO)
40 V
Collector-Base Voltage (VCBO)
40 V
Collector-Emitter Breakdown Voltage (BVCEO)
40 V
Collector-Emitter Breakdown Voltage (BVCES)
40 V
Collector-Emitter Cutoff Current (ICES)
15 nA
Collector-Emitter Cutoff Current (ICES)
15 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
0.13 V
Collector-Emitter Saturation Voltage (VCE(SAT))
0.14 V
Collector-Emitter Saturation Voltage (VCE(SAT))
0.3 V
Collector-Emitter Voltage (VCEO)
40 V
Continuous Collector Current (IC)
100 mA
Current Gain-Bandwidth Product (fT)
450 MHz
DC Current Gain (hFE)
70
DC Current Gain (hFE)
140
DC Current Gain (hFE)
150
DC Current Gain (hFE)
150
DC Current Gain (hFE)
300
DC Current Gain (hFE)
30
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Voltage (VEBO)
5 V
Input Capacitance (Cib)
5.5 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
3.5 pF
Power Dissipation (PD)
360 mW
Power Dissipation (PD)
1 W
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
486 °C/W
Thermal Resistance Junction-Case (ΘJC)
175 °C/W
Turn Off Time (toff)
150 ns
Turn On Time (ton)
40 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N4035 Box@2,000 Active 40V,100mA,360mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch EAR99 8541.21.0075 PBFREE

Resources

Analytical Test Report:Bond Wire Analytical Test Report
Analytical Test Report:Cap Analytical Test Report
Analytical Test Report:Header Analytical Test Report
Analytical Test Report:Header Assembly Analytical Test Report
LSSGP057.PDF Device Datasheet
Material Composition:TO-18 Material Composition
Package Detail Document:TO-18 Package Detail Document
Product Reliability Data:TO-18 Package Reliability Product Reliability Data