2N5210
50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 1 mA
VCE = 5 V
Test Conditions
IC = 100 µA
Test Conditions
VCB = 35 V
Test Conditions
IC = 1 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
VCE = 5 V
IC = 500 µA
f = 20 MHz
Test Conditions
VCE = 5 V
IC = 100 µA
Test Conditions
VCE = 5 V
IC = 1 mA
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VEB = 3 V
Test Conditions
VCE = 5 V
IC = 20 µA
f = 15.7 kHz
RS = 22 kΩ
Test Conditions
VCE = 5 V
IC = 20 µA
f = 1 kHz
RS = 10 kΩ
Test Conditions
VCB = 5 V
f = 100 kHz
Test Conditions
VCE = 5 V
IC = 1 mA
f = 1 kHz
Ordering
Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
---|---|---|---|---|---|---|---|
2N5210 | Box@2,500 | Active | 50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | LEAD or TIN | |
2N5210 APM | Ammo@2,000 | Active | 50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | TIN | |
2N5210 APP | Ammo@2,000 | Active | 50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | LEAD or TIN | |
2N5210 TRA | Tape & Reel@2,000 | Active | 50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | LEAD or TIN | |
2N5210 TRE | Tape & Reel@2,000 | Active | 50V,50mA,350mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise | EAR99 | 8541.21.0095 | TIN |
Resources
Item | Type |
---|---|
No matching documents found. | |
2N5209-10.PDF | Device Datasheet |
Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
Analytical Test Report:Copper Wire | Analytical Test Report |
Analytical Test Report:Epoxy Adhesive | Analytical Test Report |
Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
Analytical Test Report:Halogen Free | Analytical Test Report |
Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
Analytical Test Report:Tin Plating | Analytical Test Report |
Material Composition:TO-92 | Material Composition |
Package Detail Document:TO-92 | Package Detail Document |
Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development