2N5400

120V,600mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Voltage

Case Type: TO-92

Base-Emitter Saturation Voltage (VBE(SAT))
1 V
Base-Emitter Saturation Voltage (VBE(SAT))
1 V
Collector-Base Breakdown Voltage (BVCBO)
130 V
Collector-Base Cutoff Current (ICBO)
100 nA
Collector-Base Cutoff Current (ICBO)
100 µA
Collector-Base Voltage (VCBO)
130 V
Collector-Emitter Breakdown Voltage (BVCEO)
120 V
Collector-Emitter Saturation Voltage (VCE(SAT))
200 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
500 mV
Collector-Emitter Voltage (VCEO)
120 V
Continuous Collector Current (IC)
600 mA
Current Gain-Bandwidth Product (fT)
100 — 400 MHz
DC Current Gain (hFE)
30
DC Current Gain (hFE)
40 — 240
DC Current Gain (hFE)
40
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Cutoff Current (IEBO)
50 nA
Emitter-Base Voltage (VEBO)
5 V
Junction Temperature (Tj)
-65 — 150 °C
Noise Figure (NF)
8 dB
Output Capacitance (Cob)
6 pF
Power Dissipation (PD)
625 mW
Power Dissipation (PD)
1.5 W
Small Signal Current Gain (hfe)
30 — 200
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
200 °C/W
Thermal Resistance Junction-Case (ΘJC)
83.3 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N5400 Box@2,500 Active 120V,600mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Voltage EAR99 8541.21.0075 LEAD or TIN
2N5400 APM Ammo@2,000 Active 120V,600mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Voltage EAR99 8541.21.0075 LEAD or TIN
2N5400 TRE Tape & Reel@2,000 Active 120V,600mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Voltage EAR99 8541.21.0075 LEAD or TIN

Resources

2N5400_5401.PDF Device Datasheet
Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Copper Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Process Change Notice:CP716V replaced by CP736V Process Change Notice
Product Reliability Data:TO-92 Package Reliability Product Reliability Data

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