2N5447
25V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 50 mA
VCE = 5 V
Test Conditions
IC = 100 µA
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCB = 20 V
Test Conditions
IC = 10 mA
Test Conditions
IC = 50 mA
IB = 5 mA
Test Conditions
VCE = 5 V
IC = 50 mA
f = 20 MHz
Test Conditions
VCE = 5 V
IC = 50 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 3 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N5447 | Box@2,000 | Active | 25V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch | EAR99 | 8541.21.0075 | LEAD or TIN | |
| 2N5447 APM | Ammo@2,000 | Active | 25V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch | EAR99 | 8541.21.0075 | LEAD or TIN | |
| 2N5447 TRE | Tape & Reel@2,000 | Active | 25V,200mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP General Purpose Amplifier/Switch | EAR99 | 8541.21.0075 | LEAD or TIN |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N5447-5448.PDF | Device Datasheet |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
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| Analytical Test Report:Lead Frame | Analytical Test Report |
| Analytical Test Report:Pure Tin Solder, Sn | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |