2N5656
300V,500mA,20W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage
Case Type: TO-126
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 100 mA
VCE = 10 V
Test Conditions
VCB = 325 V
Test Conditions
IC = 1 mA
Test Conditions
IC = 100 mA
Test Conditions
VCE = 200 V
Test Conditions
VCE = 325 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 200 V
VBE(OFF) = 1.5 V
TC = 100 °C
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 250 mA
IB = 25 mA
Test Conditions
IC = 500 mA
IB = 100 mA
Test Conditions
VCE = 10 V
IC = 50 mA
f = 10 MHz
Test Conditions
VCE = 10 V
IC = 50 mA
Test Conditions
VCE = 10 V
IC = 100 mA
Test Conditions
VCE = 10 V
IC = 250 mA
Test Conditions
VCE = 10 V
IC = 500 mA
Test Conditions
VEB = 6 V
Test Conditions
VCB = 10 V
f = 100 kHz
Test Conditions
VCE = 10 V
IC = 100 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N5656 | Sleeve@50 | Discontinued | 300V,500mA,20W Through-Hole Transistor-Small Signal (<=1A) NPN High Voltage | EAR99 | 8541.29.0095 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N5655-5657.PDF | Device Datasheet |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Die Attach | Analytical Test Report |
| Analytical Test Report:Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-126 | Material Composition |
| Package Detail Document:TO-126 | Package Detail Document |
| Product EOL Notice:Power transistors bare die and | Product EOL Notice |
| Product Reliability Data:TO-126 Package Reliability | Product Reliability Data |
Product Support
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Design Support
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- Application notes
- Application and design sample kits
- Custom product and package development