2N5819
40V,750mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Current
Case Type: TO-92
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 500 mA
VCE = 2 V
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCB = 25 V
Test Conditions
VCB = 25 V
TA = 100 °C
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 µA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 2 V
IC = 50 mA
f = 20 MHz
Test Conditions
VCE = 2 V
IC = 2 mA
Test Conditions
VCE = 2 V
IC = 500 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 5 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| 2N5819 | Box@2,000 | Active | 40V,750mA,625mW Through-Hole Transistor-Small Signal (<=1A) PNP High Current | EAR99 | 8541.21.0075 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| 2N5814-2N5819.PDF | Device Datasheet |
| Analytical Test Report:Copper Bonding Wire | Analytical Test Report |
| Analytical Test Report:Copper Wire | Analytical Test Report |
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| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Halogen Free | Analytical Test Report |
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| Analytical Test Report:Tin Plating | Analytical Test Report |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |
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