2N5961

60V,50mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise

Case Type: TO-92

Base-Emitter On Voltage (VBE(ON))
500 — 700 mV
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Cutoff Current (ICBO)
2 nA
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Saturation Voltage (VCE(SAT))
200 mV
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current (IC)
50 mA
Current Gain-Bandwidth Product (fT)
100 MHz
DC Current Gain (hFE)
100
DC Current Gain (hFE)
120
DC Current Gain (hFE)
135
DC Current Gain (hFE)
150 — 700
Emitter-Base Breakdown Voltage (BVEBO)
7 V
Emitter-Base Cutoff Current (IEBO)
1 nA
Emitter-Base Voltage (VEBO)
7 V
Input Capacitance (Cib)
6 pF
Junction Temperature (Tj)
-65 — 150 °C
Noise Figure (NF)
6 dB
Noise Figure (NF)
3 dB
Noise Figure (NF)
3 dB
Output Capacitance (Cob)
4 pF
Power Dissipation (PD)
625 mW
Power Dissipation (PD)
1.5 W
Small Signal Current Gain (hfe)
150 — 1000
Storage Temperature (Tstg)
-65 — 150 °C

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
2N5961 Box@2,500 Discontinued 60V,50mA,625mW Through-Hole Transistor-Small Signal (<=1A) NPN Low Noise EAR99 8541.21.0075 LEAD or TIN

Resources

2N5961-62-63.PDF Device Datasheet
Analytical Test Report:Copper Bonding Wire Analytical Test Report
Analytical Test Report:Copper Wire Analytical Test Report
Analytical Test Report:Epoxy Adhesive Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Free Analytical Test Report
Analytical Test Report:Pure Tin Solder, Sn Analytical Test Report
Analytical Test Report:Tin Plating Analytical Test Report
Material Composition:TO-92 Material Composition
Package Detail Document:TO-92 Package Detail Document
Product EOL Notice:CMPT930 Product EOL Notice
Product Reliability Data:TO-92 Package Reliability Product Reliability Data

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